EM:IP

Educational Measurement: Issues and Practice

EM:IP is edited by Heather Buzick and published by John Wiley & Sons, Inc.  See the Journal Overview and Author Guidelines for more information.

EM:IP is a quarterly publication that is aimed at practitioners and users of tests, as well as professional educators, legislators, school personnel, and interested citizens. Its primary purpose is to promote a better understanding of educational measurement and to encourage reasoned debate on current issues of practical importance to educators and the public. EM:IP also provides one means of communication among NCME members and between NCME members and others concerned with educational measurement issues and practices.

The 2025 EM:IP Cover Graphic/Data Visualization Competition

EM:IP graph

The 12th Educational Measurement: Issues and Practice (EM:IP) Cover Graphic/Data Visualization Competition is back for its 12th year! The editorial staff at EM:IP is inviting the NCME membership to submit your thoughtful and creative diagrams and data visualizations that convey a clear, concise, and easy-to-understand message about educational or psychological data. Your entry could be featured on the cover of a future issue!

Click here for the detailed 2025 call for submissions.

Winning Entries

The winning submission(s) will be printed on a future cover of an EM:IP issue. Other strong submissions may be published online or saved for future issues. You may re-submit an entry from a previous year’s competition. Submissions are due by 5 PM PST Monday, February 10, 2025. We will announce the winner(s) at the NCME 2025 Annual Meeting.


EM:IP ISSUES

NCME members can access full articles in EM:IP (1982 - present) through the Wiley Online Library. You will need to sign in before you can access full articles.

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Supplemental Materials


EM:IP Cover Gallery

The EM:IP Cover Gallery displays high-resolution, full page views of cover illustrations from 2010 to the present, with links to both the journal and the article describing each visual.


Questions?

Contact the Editor in Chief:

Heather Buzick
(hbuzick@ets.org)