EM:IP

Educational Measurement: Issues and Practice

EM:IP is edited by Dr. Zhongmin Cui and published by John Wiley & Sons, Inc.  See Journal Overview and Author Guidelines for more information.

EM:IP is a quarterly publication that is aimed at practitioners and users of tests, as well as professional educators, legislators, school personnel, and interested citizens. Its primary purpose is to promote a better understanding of educational measurement and to encourage reasoned debate on current issues of practical importance to educators and the public. EM:IP also provides one means of communication among NCME members and between NCME members and others concerned with educational measurement issues and practices.


EM:IP ISSUES

NCME members can access full articles in EM:IP (1982 - present) through the Wiley Online Library. You will need to sign in before you can access full articles.

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Supplemental Materials


EM:IP Cover Gallery

The EM:IP Cover Gallery displays high-resolution, full page views of cover illustrations from 2010 to the present, with links to both the journal and the article describing each visual.


Questions?

Email: Yuan-Ling Liaw
(yuan-ling.liaw@iea-hamburg.de)