Through-year assessments are generally assessments that are administered in multiple parts and at different times over the course of a school year (Lorié et al., 2021; Dadey & Gong, 2023). These assessments are referred to in other ways that include instructionally-embedded, through-course, and periodic assessment. There are a number of through-year assessment models, and they have gained favor for a variety of reasons that include their potential to inform subsequent instruction, be more closely aligned with and responsive to curricula and instruction, provide opportunities for proximal measures of learning, and be a more sensitive measure of student progress or growth than typical year-end summative assessments (ATLAS, 2020; Clark et al., 2017; Gong, 2021; NWEA, 2020; Wise, 2011).
The varied uses of through-year assessment systems, however, have raised questions about the criteria used to evaluate the technical quality of these assessments. Criteria related to the definition of assessment targets for status versus growth, content domain sampling, the relationship among the multiple forms or tests, and the aggregation and weighting of results, for example, have implications for an assessment's design and the validity of the interpretation of results (Gong, 2021; Wise, 2011). In this digital ITEMS module, Dr. Nathan Dadey, Dr. Brian Gong, Yun-Kyung Kim, and Dr. Edynn Sato present information about through-year assessment, including discussion of major test design elements and considerations, key challenges that pose a threat to assessment validity and utility, and recommended methods to address these challenges, and considerations for implementation. Examples and discussion of through-year assessment models also are provided.